Imaging-Spectroscopy for BIF-Monitors in Rare Gases and Nitrogen

For transverse profile determination a non-intercepting Beam Induced Fluorescence (BIF)-monitor was developed. The BIF-monitor detects fluorescence light emitted by residual gas molecules after atomic collisions with beam ions [1]. Using an imaging spectrograph the spectral response was mapped and associated with the corresponding gas transitions in helium, argon, krypton, xenon and nitrogen. Spectrally resolved beam profiles were obtained from the spectrographic images simultaneously. The present study with 5 MeV/u proton, S and Ta-ions reproduced the results of earlier studies with a 95 keV proton beam [2]. Moreover, the camera system connected to the spectrograph was image intensified, to provide single photon detection in order to resolve even weak transitions [3].